CMOS tri-state control circuit for a bidirectional I/O with slew

Electronic digital logic circuitry – Tri-state – With field-effect transistor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

326 57, 326 83, H03K 1900

Patent

active

061631698

ABSTRACT:
A digital circuit pulls up an output node using an NFET device. The digital circuit is part of a CMOS predriver having balanced delays for coming out of tristate mode and for data mode operation. The predriver has size and speed capability advantages and is particularly advantageous when followed by a CMOS driver powered by a lower positive voltage supply.

REFERENCES:
patent: 4217502 (1980-08-01), Suzuki et al.
patent: 4638187 (1987-01-01), Boler et al.
patent: 4724340 (1988-02-01), Sood
patent: 4731553 (1988-03-01), Van Lehn et al.
patent: 4800298 (1989-01-01), Yu et al.
patent: 4859877 (1989-08-01), Cooperman et al.
patent: 5041738 (1991-08-01), Walters, Jr.
patent: 5073726 (1991-12-01), Kato et al.
patent: 5115150 (1992-05-01), Ludwig
patent: 5311076 (1994-05-01), Park et al.
patent: 5324996 (1994-06-01), Mote, Jr.
patent: 5381059 (1995-01-01), Douglas
patent: 5594370 (1997-01-01), Nguyen et al.
patent: 5719506 (1998-02-01), Diba et al.
patent: 6023174 (2000-02-01), Kirsch

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

CMOS tri-state control circuit for a bidirectional I/O with slew does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with CMOS tri-state control circuit for a bidirectional I/O with slew, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and CMOS tri-state control circuit for a bidirectional I/O with slew will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-273858

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.