CMOS logic gate fabricated on hybrid crystal orientations...

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With specified crystal plane or axis

Reexamination Certificate

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C257S347000, C257S371000, C257S527000, C257SE27112

Reexamination Certificate

active

10989080

ABSTRACT:
In preferred embodiments of the present invention, a method of forming CMOS devices using SOI and hybrid substrate orientations is described. In accordance with a preferred embodiment, a substrate may have multiple crystal orientations. One logic gate in the substrate may comprise at least one N-FET on one crystal orientation and at least one P-FET on another crystal orientation. Another logic gate in the substrate may comprise at least one N-FET and at least one P-FET on the same orientation. Alternative embodiments further include determining the preferred cleavage planes of the substrates and orienting the substrates relative to each other in view of their respective preferred cleavage planes. In a preferred embodiment, the cleavage planes are not parallel.

REFERENCES:
patent: 4857986 (1989-08-01), Kinugawa
patent: 4889829 (1989-12-01), Kawai
patent: 5384473 (1995-01-01), Yoshikawa et al.
patent: 6107125 (2000-08-01), Jaso et al.
patent: 6580154 (2003-06-01), Noble et al.
patent: 6657259 (2003-12-01), Fried et al.
patent: 6902962 (2005-06-01), Yeo et al.
patent: 6995456 (2006-02-01), Nowak
patent: 2003/0094874 (2003-05-01), Ipposhi et al.
patent: 2004/0119100 (2004-06-01), Nowak et al.
patent: 2004/0256700 (2004-12-01), Doris et al.
Yang, et al., “5nm-Gate Nanowire FinFET,” Symposium on VLSI Technology Digest of Technical Papers (2004) pp. 196-197.
Yang, et al., “On the Integration of CMOS with Hybrid Crystal Orientations,” Symposium on VLSI Technology Digest of Technical Papers (2004) pp. 160-161.
Okagaki, et al., “Direct Measurement of Stress Dependent Inversion Layer Mobility Using a Novel Test Structure,” Symposium on VLSI Technology Digest of Technical Papers (2004) pp. 120-121.
Yang, et al., “High Performance CMOS Fabricated on Hybrid Substrate With Different Crystal Orientations,” IEEE (2003) 4 pages.
Smith, Charles S., “Piezoresistance Effect in Germanium and Silicon,” Physical Review, vol. 94, No. 1 (Apr. 1, 1954), pp. 42-49.

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