Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate
2006-04-04
2006-04-04
Thompson, Craig A. (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
With particular signal path connections
C438S132000, C365S096000
Reexamination Certificate
active
07023031
ABSTRACT:
A CMOS image sensor formed on a chip has a ROM disposed on the chip for recording pixel defect locations, chip-by-chip variations such as bias, and other manufacturing production data. Testing results and repair solutions are written to the ROM after production testing. A simple circuit for writing information to the ROM also is provided on the CMOS chip. During operational use of the image sensor, data is read from the on-chip ROM to assist in compensating for manufacturing process variations.
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Dickstein , Shapiro, Morin & Oshinsky, LLP
Dolan Jennifer M
Micro)n Technology, Inc.
Thompson Craig A.
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