CMOS image sensor with a microlens and method for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S292000

Reexamination Certificate

active

07659565

ABSTRACT:
A CMOS image sensor and a method for fabricating the same are provided. A CMOS image sensor includes: a plurality of photodiodes a predetermined distance apart on a semiconductor substrate; an insulation layer on an entire surface of the semiconductor substrate; a passivation layer on the insulation layer; a plurality of color filters on the passivation layer corresponding to the photodiodes; a planarization layer on an entire surface of the semiconductor substrate including the color filters; and a microlens on the planarization layer corresponding to each of the color filters and having a bottom diameter of 2.5 to 3.0 μm.

REFERENCES:
patent: 6417022 (2002-07-01), Hsiao et al.
patent: 2006/0033131 (2006-02-01), Kim
patent: 2006/0057928 (2006-03-01), Nagasaka et al.
patent: 2006/0124948 (2006-06-01), Lee

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

CMOS image sensor with a microlens and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with CMOS image sensor with a microlens and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and CMOS image sensor with a microlens and method for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4165638

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.