CMOS image sensor and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S069000, C257S432000, C438S065000, C438S066000, C438S113000, C438S460000, C438S464000

Reexamination Certificate

active

07491993

ABSTRACT:
Disclosed are a CMOS image sensor capable of improving the focusing capability of light and a method for manufacturing the same. The CMOS image sensor includes a plurality of first micro-lenses formed in the upper part of the planarization layer, each of the first micro-lenses arranged over a corresponding photodiode, and a plurality of second micro-lenses formed on the planarization layer, each of the plurality of second micro-lenses wrapping a corresponding first micro-lens respectively.

REFERENCES:
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patent: 6661046 (2003-12-01), Kim
patent: 6821810 (2004-11-01), Hsiao et al.
patent: 6831311 (2004-12-01), Uchida
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patent: 7227692 (2007-06-01), Li et al.
patent: 2002/0079504 (2002-06-01), Kim
patent: 2004/0130794 (2004-07-01), Houlihan et al.
patent: 2005/0128596 (2005-06-01), Li et al.
patent: 2005/0139832 (2005-06-01), Jeon
patent: 2005/0242271 (2005-11-01), Weng et al.
patent: 2003-204050 (2003-07-01), None
patent: 10-2004-0059760 (2004-07-01), None
patent: 1020040059760 (2004-07-01), None

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