Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
Reexamination Certificate
2011-06-07
2011-06-07
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Optimization
C716S101000, C716S132000, C713S322000
Reexamination Certificate
active
07958483
ABSTRACT:
An embodiment of the invention includes receiving an indicator of an activity-level of a functional block within an electronic chip. The functional block is configured to receive a clock signal from a clock signal generator. The clock signal to at least a portion of a functional block is disabled for a number of inactive clock cycles during a clock segment of the clock signal. The clock segment has a specified number of clock cycles and the number of inactive clock cycles is defined based on the activity-level and the specified number of clock cycles of the clock segment.
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Alben Jonah M.
Hasslen, III Robert J.
Treichler Sean J.
Cooley LLP
Nvidia Corporation
Siek Vuthe
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