Clock skew measurement circuit on a microprocessor die

Details Clock skew measurement circuit on a microprocessor die Clock skew measurement circuit on a microprocessor die

2006-11-28

2006-11-28

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S079000, C702S089000, C375S226000, C375S376000

Reexamination Certificate

active

07142998

ABSTRACT:
A structure and related method for determining the uncertainty window associated with clock signals on a microprocessor using circuitry on the microprocessor die itself and external software. A target clock signal of interest is compared to a series of reference clock signals having the same frequency, but differing in phase relationship. Where the target clock signal makes state transitions with respect to the various reference clock signals over the course of several thousand comparisons is indicative of the uncertainty window for that target clock. By adjusting the phase relationship between the reference clock signals, and thereby adjusting the width of the time windows defined by corresponding features of the reference clock signals, the uncertainty window for the target clock signal may be iteratively determined.

REFERENCES:
patent: 5663991 (1997-09-01), Kelkar et al.
patent: 5701335 (1997-12-01), Neudeck
patent: 5818265 (1998-10-01), Meller et al.
patent: 5889435 (1999-03-01), Smith et al.
patent: 6127871 (2000-10-01), Moll
patent: 6163586 (2000-12-01), Hongbin Hao et al.
patent: 6184753 (2001-02-01), Ishimi et al.
patent: 6222400 (2001-04-01), Fukuda et al.
patent: 6229363 (2001-05-01), Eto et al.
patent: 6346837 (2002-02-01), Shibayama
patent: 2003/0120456 (2003-06-01), Watson, Jr. et al.

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