4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Time duration or rate

Oscar Mendoza

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Clock skew measurement circuit on a microprocessor die

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Clock skew measurement circuit on a microprocessor die

Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2650585

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