Electrical computers and digital processing systems: support – Clock – pulse – or timing signal generation or analysis
Reexamination Certificate
2008-09-02
2008-09-02
Perveen, Rehana (Department: 2116)
Electrical computers and digital processing systems: support
Clock, pulse, or timing signal generation or analysis
C713S400000, C713S600000
Reexamination Certificate
active
11370381
ABSTRACT:
A clock generation circuit for an integrated circuit device, such as an SOC, has increased test coverage. The clock generation circuit includes first and second latches that receive an input clock signal at their clock inputs and a selector that receives at first and second data inputs respectively, the input clock signal and an output of the second latch circuit, which is a divided clock signal. A logic gate has a first input connected to an output of the first latch and a second input that receives a scan mode signal. The logic gate generates a selector control signal provided to the selector.
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Mitra Arnab K.
Singh Amrit
Vig Nitin
Bergere Charles
Freescale Semiconductor Inc.
Perveen Rehana
Stoynov Stefan
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