Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates – Field-effect transistor
Reexamination Certificate
2011-02-22
2011-02-22
Tan, Vibol (Department: 2819)
Electronic digital logic circuitry
Clocking or synchronizing of logic stages or gates
Field-effect transistor
C327S218000, C714S732000
Reexamination Certificate
active
07893722
ABSTRACT:
State storage circuitry is described comprising a master-slave latch having tristate inverter circuitry2at its functional input and tristate scan signal insertion circuitry12for inserting scan data. The tristate scan signal insertion circuitry12is controlled by a first clock signal nclk and a second clock signal bclk. The tristate inverter circuitry2is controlled by a third clock signal nfclk and a fourth clock signal flck. The clock generating circuitry holds the third and fourth clock signals at fixed values which tristate the tristate inverter circuitry2when in scan mode. This moves scan control logic out of the function path comprising the tristate inverter circuitry into the clock control circuitry.
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Frederick Marlin Wayne
Huang Chih-Wei
Kvinta Stephen Andrew
ARM Limited
Nixon & Vanderhye P.C.
Tan Vibol
White Dylan
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