Cleaning process for phase shift masks

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C134S003000, C134S002000, C510S175000

Reexamination Certificate

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06841311

ABSTRACT:
A new sequence and chemical composition for cleaning the surface of a halftone shift masks that use MoSiON as shifter material is provided. For purposes of repair or rework, the pellicle is removed from the mask so that the mask can be accessed. After the rework or repair has been completed, a new clean process is performed, for the new clean process the sequence of steps that is conventionally performed has been modified. After the new clean process has been completed, the pellicle is reinstalled over the surface of the mask.

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patent: 5439763 (1995-08-01), Shimase et al.
patent: 5547516 (1996-08-01), Luch
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patent: 5679483 (1997-10-01), Maurer
patent: 6723477 (2004-04-01), Nozawa et al.
patent: 6743553 (2004-06-01), Shiota et al.
patent: 508642 (2002-11-01), None

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