Circuits and methods for matching device characteristics for...

Details Circuits and methods for matching device characteristics for... Circuits and methods for matching device characteristics for...

2006-08-01

2006-08-01

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07086020

ABSTRACT:
Circuit designs and methods are provided for matching device characteristics for, e.g., analog or mixed-signal semiconductor integrated circuit designs. In particular, circuit layout patterns and layout methods are provided which enable precise or proportional matching of circuit components by uniformly distributing circuit components in a manner that eliminates or significantly minimizes the sensitivity of such circuit components to environmental effects and process variations, thereby improving the performance of analog and mixed-signal circuits.

REFERENCES:
patent: 5557234 (1996-09-01), Collins
patent: 5952698 (1999-09-01), Wong et al.
patent: 6172555 (2001-01-01), Gusinov
patent: 6876576 (2005-04-01), Hidaka
patent: 2002/0163835 (2002-11-01), Chen et al.
patent: 2005/0044522 (2005-02-01), Maeda
patent: 2005/0076320 (2005-04-01), Maeda

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