Circuitry for a programmable element

Static information storage and retrieval – Read/write circuit – Having fuse element

Reexamination Certificate

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Details

C365S063000, C365S096000, C365S164000, C365S189020, C327S538000, C327S541000, C327S543000

Reexamination Certificate

active

11177863

ABSTRACT:
As part of anti-fuse circuitry for a memory device, a preferred exemplary embodiment of the current invention provides a direct connection between an anti-fuse and a contact pad used to provide voltage to that anti-fuse. The contact pad also serves as a voltage source for at least one other part of the memory device. At least one circuit coupled to the anti-fuse is temporarily isolated from it in the event that a voltage present at the pad would damage the circuit or cause the circuit to improperly read the status of the anti-fuse. The contact pad is available during a probe stage of the in-process memory device, but once the device is packaged, access to that contact pad is prevented. At the backend of the production process, the anti-fuse may be accessed through a second pad, whose electrical communication with the anti-fuse is regulated.

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