Electronic digital logic circuitry – Reliability – Redundant
Reexamination Certificate
2007-05-29
2007-05-29
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
Reliability
Redundant
C326S008000, C326S009000, C326S014000
Reexamination Certificate
active
11014170
ABSTRACT:
By adding redundant logic gates into a circuit without changing function of the whole circuit, the present invention can tolerate certain delay variations. The present invention can be applied in the IC industries to improve the yield in semiconductor manufacturing.
REFERENCES:
patent: 4839855 (1989-06-01), Van Driel
patent: 2004/0230935 (2004-11-01), Samudrala et al.
National Tsing Hua University
Tran Anh Q.
Troxell Law Office PLLC
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