Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-07-25
2006-07-25
Zarabian, Amir (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S154000, C365S189080, C365S189110, C365S233100, C365S239000, C331S057000
Reexamination Certificate
active
07082067
ABSTRACT:
A circuit for measuring the performance of a memory cell. The circuit includes a ring oscillator, which includes a plurality of memory cells. The performance of the memory cell can be determined from an oscillation frequency of the ring oscillator. The circuit accurately verifies the performance of the memory cell without modifying the memory cell. This avoids altering the transient AC characteristics of the memory cell when predicting its performance.
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Castagnetti Ruggero
Venkatraman Ramnath
LSI Logic Corporation
Pham Ly Duy
Strategic Patent Group
Zarabian Amir
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