Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2011-08-09
2011-08-09
Tran, Andrew Q (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189090, C365S189050, C365S210120
Reexamination Certificate
active
07995408
ABSTRACT:
A reference voltage supplying circuit can include an internal reference voltage generating unit configured to generate an internal reference voltage, a pad configured to receive an external reference voltage, a switching unit selectively configured to supply the internal reference voltage or the external reference voltage to an internal voltage generator in a test mode.
REFERENCES:
patent: 5838076 (1998-11-01), Zarrabian et al.
patent: 5973548 (1999-10-01), Ukita et al.
patent: 6429729 (2002-08-01), Kobayashi et al.
patent: 7057446 (2006-06-01), Choi et al.
patent: 2002/0105847 (2002-08-01), Kono et al.
patent: 2001-358299 (2001-12-01), None
patent: 1019980075712 (1998-11-01), None
patent: 1020050064669 (2005-06-01), None
Baker & McKenzie LLP
Hynix / Semiconductor Inc.
Tran Andrew Q
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