Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Patent
1996-06-24
1998-06-16
Tran, Toan
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
Fusible link or intentional destruct circuit
H01H 8500, H03K 19003
Patent
active
057677328
ABSTRACT:
In a semiconductor integrated circuit, an internal passive circuit element value, such as a resistance, is permanently configured to a desired value by selectively fusing one or more fusing elements in response to corresponding input signals. An internal monitor circuit determines whether or not all of the requested fusing operations were successfully completed and, if so, permanently inhibits any further fusing operations. The circuit has the advantage of obviating external measurement of the adjusted circuit element value and further obviates the need for application of a lock input signal to inhibit further fusing operations. Accordingly, testing is simplified and the number of external pins is reduced.
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patent: 4937465 (1990-06-01), Johnson et al.
patent: 5404049 (1995-04-01), Canada et al.
patent: 5448199 (1995-09-01), Park
patent: 5450030 (1995-09-01), Shin et al.
patent: 5469077 (1995-11-01), Cox
patent: 5517455 (1996-05-01), McClure et al.
Kim Yang-gyun
Lee Jeong-in
Englund Terry L.
Samsung Electronics Co,. Ltd.
Tran Toan
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