Circuit for and method of testing a memory device

Details Circuit for and method of testing a memory device Circuit for and method of testing a memory device

2004-12-23

2009-08-11

Tsai, Henry W. H. (Department: 2184)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C710S052000, C713S400000, C714S731000, C714S744000

Reexamination Certificate

active

07574635

ABSTRACT:
Circuit and methods for testing a memory device are disclosed. According to one aspect of the invention, a circuit for testing an asynchronous data transfer comprises a first circuit receiving a stream of data in response to a clock signal in a first clock domain. A second circuit coupled to the first circuit receives the stream of data from the first circuit in response to a low level of an empty signal in the second clock domain. A comparator circuit coupled to receives the stream of data and the output of the second circuit. Specific applications to dual port RAMs as well as implementations in a programmable logic devices are disclosed. Various methods of testing an asynchronous data transfer are also disclosed.

REFERENCES:
patent: 5471583 (1995-11-01), Au et al.
patent: 5481549 (1996-01-01), Tokuyama
patent: 5953372 (1999-09-01), Virzi
patent: 6366530 (2002-04-01), Sluiter et al.
patent: 6385236 (2002-05-01), Chen
patent: 6788109 (2004-09-01), Kitagawa
patent: 6949955 (2005-09-01), Glasser
patent: 7161999 (2007-01-01), Parikh
patent: 2003/0185325 (2003-10-01), Wahl
U.S. Appl. No. 10/838,957, filed May 4, 2004, Lowe et al.

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