Circuit design verification tool and method therefor using maxwe

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

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703 14, 703 15, G06F 1750

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active

061065676

ABSTRACT:
Very high speed circuits are adversely effected by parasitic capacitances and line resistances. At high speeds these values of capacitance and resistance change with frequency. A method of verification of the design of high speed circuits includes a simulation of the effects of these changes in resistance and capacitance which occur at high frequency. There is a logic component and a physical-layout component which are combined to provide a full simulation of the circuit taking into account these effects which occur at very high frequency. The physical-layout component utilizes Maxwell's equations in their entirety without removing the time dependent effects. One embodiment considers only cases defined by the bus protocol, reducing the computational penalty of complete electromagnetic simulation.

REFERENCES:
patent: 5243547 (1993-09-01), Tsai et al.
patent: 5379231 (1995-01-01), Pillage et al.
patent: 5615137 (1997-03-01), Holzmann et al.
patent: 5905883 (1999-05-01), Kasuya
patent: 5920711 (1999-07-01), Seawright et al.
patent: 5966306 (1999-10-01), Nodine et al.
Poltz, J., "Determining Noise Levels in VLSI Circuits," IEEE International Symposium on Electromagnetic Compatibility, 1993, pp. 340-345, Aug. 1993.
Kim, S.Y., Tuncer, E., Gupta, R., Krauter, B., Savarino, T., Neikirk, D.P., and Pillage, L.T., "An Efficient Methodology for Extraction and Simulation of Transmission Lines for Application Specific Electronic Modules," IEEE/ACM International Conference on Nov. 1993.
Gupta, R., Seok-Yoon Kim, and Pillage, L.T., "Domain Characterization of Transmission Line Models for Efficient Simulation," Proceedings of the IEEE International Conference on Computer Design: VLSI in Computers and Processors, 1994, pp. 558-562, Oct. 1994.
Beker, B., Cokkinides, G., and Templeton, A., "Analysis of Microwave Capacitors and IC Packages," IEEE Transactions on Microwave Theory and Techniques, vol. 42, No. 9, Sep. 1994, pp. 1759-1764, Sep. 1994.
Smedes, T., van der Meijs, N.P., and van Genderen, A.J., "Extraction of Circuit Models for Substrate Cross-talk," Proceedings of the IEEE/ACM International Conference on Computer-aided Design, 1995, pp. 199-206, Nov. 1995.
Kamon, M. and Majors, S.S., "Package and Interconnect Modeling of the HFA3624, a 2.4 GHz RF to IF Converter," Proceedings of the 33rd Annual Conference on Design Automation, 1996, pp. 2-7, Jun. 1996.
van der Meijs, N.P., and Smedes, T., "Accurate Interconnect Modeling: Towards Multi-million transistor Chips as Microwave Circuits," Proceedings of the IEEE/ACM International Conference on Computer-aided Design, 1996, pp. 244-251, Nov. 1996.
Jong-Gwan Yook, Katehi, L.P.B., Sakallah, K.A., Martin, R.S., Huang, L., and Schreyer, T.A., "Application of System-Level EM Modeling to High-speed Digital IC Packages and PCB's," IEEE Transactions on Microwave Theory and Techniques, vol. 45, No. 10, p. 1, Oct. 1997.
Chiprout, E., "Hierarchical Interconnect Modeling," Technical Digest of the International Electron Devices Meeting, 1997, pp. 125-128, Dec. 1997.

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