Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-27
2009-10-06
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07600203
ABSTRACT:
A circuit design system has: a storage unit in which a netlist is stored; a fault-candidate extracting module configured to extract equivalent fault class Gifrom the netlist; a judgment module configured to select a target node out of a plurality of nodes Ni1to Nijiincluded in the equivalent fault class Gi, wherein Jiis a number of nodes included in the equivalent fault class Gi; and an observation-point inserting module configured to update the netlist by inserting at least one observation point into the target node. The judgment module decides the target node based on the number Ji.
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Lin Aric
NEC Electronics Corporation
Siek Vuthe
Young & Thompson
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