Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-09-17
2010-11-16
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07836415
ABSTRACT:
In a circuit design method, a computer calculates power of each of cells, calculates an IR drop value by calculating a voltage decreased due to an IR drop for each cell by using the power for each cell, determines whether a difference between a current IR drop value and a previous IR drop is equal to or less than a predetermined value, and defines a voltage after the IR drop occurs for each cell by using the IR drop value when the difference is greater than the predetermined value. The computer repeats calculating the power, calculating the IR drop value, and defining the value after the IR drop occurs until the difference becomes equal to or less than the predetermined value.
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patent: 7240304 (2007-07-01), Dutta et al.
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patent: 2002-342400 (2002-11-01), None
Fujitsu Patent Center
Fujitsu Semiconductor Limited
Siek Vuthe
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