Static information storage and retrieval – Read/write circuit – Testing
Patent
1998-08-31
1999-08-31
Nguyen, Viet Q.
Static information storage and retrieval
Read/write circuit
Testing
36518509, 365200, 36518522, 371 211, G11C 1300
Patent
active
059462493
ABSTRACT:
A circuit configuration for a programmable nonvolatile memory having memory cells organized in rows and columns, includes a programming circuit which contains a first device for testing purposes that applies a programming current to a first predetermined number of memory cells in parallel for a first predetermined time period. During a second predetermined time period, the device thereupon connects a second predetermined number, which is greater than the first number, in parallel an applies the programming current to them. A method is provided for operating the circuit configuration.
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Japanese Patent Abstract No. 61165898 (Shinichi), dated Jul. 26, 1986.
Japanese Patent Abstract No. 63153797 (Koichi), dated Jun. 27, 1988.
Georgakos Georg
Kern Thomas
Sommer Diether
Zettler Thomas
Greenberg Laurence A.
Lerner Herbert L.
Nguyen Viet Q.
Siemens Aktiengesellschaft
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