Circuit arrangement for measuring leakage current utilizing a di

Details Circuit arrangement for measuring leakage current utilizing a di Circuit arrangement for measuring leakage current utilizing a di

1997-10-31

2000-01-04

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3126, G01R 1300

Patent

active

060114037

ABSTRACT:
A circuit arrangement for use in a semiconductor integrated circuit tester for measuring leakage current supplied from a pin of a semiconductor integrated circuit device under test (DUT) to a programmed voltage level includes a voltage source having an output terminal, a feedback mechanism connected between the DUT pin and the voltage source for controlling the voltage source to force the DUT pin to the programmed voltage level, a capacitor connected between the output terminal of the voltage source and the DUT pin, and a circuit for measuring voltage developed across the capacitor.

REFERENCES:
patent: 4092589 (1978-05-01), Chau et al.
patent: 5200696 (1993-04-01), Menis et al.
patent: 5543728 (1996-08-01), Grace et al.

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