Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2007-05-04
2008-10-21
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S149000, C365S200000
Reexamination Certificate
active
07440347
ABSTRACT:
Method and apparatus for testing for a short between a wordline being tested and a bitline in a memory device. The method includes applying a first voltage to the bitline using a first voltage source and applying a second voltage to the wordline being tested using a second voltage source. The method further includes disconnecting the wordline being tested from the second voltage source; and after disconnecting the wordline being tested from the second voltage source, activating the wordline being tested, thereby connecting the wordline being tested to a wordline power supply line. A determination is made of whether a voltage of the wordline power supply line indicates a short between the wordline being tested and the bitline. The determination is based on the voltage of the wordline power supply line relative to the first voltage and the second voltage.
REFERENCES:
patent: 5343431 (1994-08-01), Ohtsuka et al.
patent: 5606527 (1997-02-01), Kwack et al.
patent: 5748545 (1998-05-01), Lee et al.
patent: 6781902 (2004-08-01), Oumiya et al.
patent: 2007/0153596 (2007-07-01), Kilian et al.
Nguyen Tan T.
Patterson & Sheridan L.L.P.
Qimonda North America Corp.
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