Circuit and method of measuring the negative threshold voltage o

Details Circuit and method of measuring the negative threshold voltage o Circuit and method of measuring the negative threshold voltage o

1998-01-20

1999-03-23

Dinh, Son T.

Static information storage and retrieval

Floating gate

Particular biasing

36518518, 36518522, 36518524, G11C 1606

Patent

active

058869263

ABSTRACT:
A portable data carrier (10) embodies an integrated circuit (12) with an EEPROM (24). The EEPROM has a number of rows of memory cells (32, 38) each having outputs respectively coupled to bit lines (50, 54). The EEPROM cells have a common array ground node (56). A pull-up transistor (74) is coupled to the common array ground node for developing a first positive voltage on the common array ground node which in turn develops a second positive voltage on the output of one of the memory cells corresponding to a negative threshold voltage of the memory cells. A sensing circuit (88) is coupled to one of the bit lines for detecting the level of the second positive voltage and thus determining the negative threshold voltage of the memory cell.

REFERENCES:
patent: 5117392 (1992-05-01), Harada
patent: 5579274 (1996-11-01), Van Buskirk et al.
patent: 5600594 (1997-02-01), Padoan et al.
patent: 5748534 (1998-05-01), Dunlap et al.
patent: 5790459 (1998-08-01), Roohparver

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