Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2007-03-13
2007-03-13
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S222000, C365S096000, C327S525000, C327S526000
Reexamination Certificate
active
11054645
ABSTRACT:
An antifuse circuit and antifuse reading method for determining whether an antifuse is programmed or un-programmed. An antifuse circuit includes a sensing circuit having a sense node coupled to the antifuse that is configured to generate a reference current and compare a sense current at the sense node relative to the reference current. The sensing circuit generates an output signal having a first logic level in response to the sense current being greater than the reference current and generates the output signal having a second logic level in response to the sense current being less than the reference current. The logic level of the output signal indicative of whether the antifuse is programmed or un-programmed.
REFERENCES:
patent: 5345110 (1994-09-01), Renfro et al.
patent: 5514980 (1996-05-01), Pilling et al.
patent: 5583463 (1996-12-01), Merritt
patent: 5619469 (1997-04-01), Joo
patent: 5631862 (1997-05-01), Cutter et al.
patent: 5831923 (1998-11-01), Casper
patent: 5923672 (1999-07-01), Roberts et al.
patent: 5956282 (1999-09-01), Casper
patent: 5978297 (1999-11-01), Ingalls
patent: 6087890 (2000-07-01), Kim
patent: 6266291 (2001-07-01), Sher et al.
patent: 6351425 (2002-02-01), Porter
patent: 6384666 (2002-05-01), Bertin et al.
patent: 6430101 (2002-08-01), Toda
patent: 6882202 (2005-04-01), Lehman et al.
patent: 6937495 (2005-08-01), Scheuerlein
patent: 2003/0174568 (2003-09-01), Blodgett
patent: 2004/0151048 (2004-08-01), Cho
patent: 2004/0174204 (2004-09-01), Tsujino et al.
Dixit Abhay
Pan Dong
Dorsey & Whitney LLP
Micro)n Technology, Inc.
Phung Anh
Wendler Eric J.
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