Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Patent
1998-02-27
2000-09-12
Niebling, John F.
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
324763, G01R 3126
Patent
active
061176966
ABSTRACT:
A circuit (10) for reading a voltage at a voltage source (14) of an integrated circuit (12). In one embodiment, the circuit (110) comprises a pass circuit (118) that has an input coupled to the node (114) of the integrated circuit (12). The circuit (110) provides a measurement of the voltage at the node (114) as an output to a pin (116). A reset circuit (122) is coupled to the pass circuit (118) and is operable to activate and reset the pass circuit (118). Finally, a pass control circuit (120) is coupled to provide an output signal to the pass circuit (118) that drives the pass circuit (118) when active to pass the voltage at the node (114) to the pin (116).
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Duesman Kevin G.
Loughmiller Daniel R.
Sher Joseph C.
Micro)n Technology, Inc.
Murphy John
Niebling John F.
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