Circuit and method for determining integrated circuit...

Details Circuit and method for determining integrated circuit... Circuit and method for determining integrated circuit...

2006-05-30

2006-05-30

Nguyen, Van Thu (Department: 2824)

Static information storage and retrieval

Read/write circuit

Signals

C365S233100, C370S519000, C370S517000, C370S516000, C327S395000, C327S400000

Reexamination Certificate

active

07054205

ABSTRACT:
A circuit and method is provided for determining the delay of an integrated circuit common associated with chip-to-chip variations in the manufacturing process, changes in operating voltage, and fluctuations in temperature. A clock signal is inverted, thus generating an inverted clock signal which is then delayed multiple times, resulting in several delayed versions of the inverted clock signal, with each version being delayed a different length of time. The logical state of each delayed version of the inverted clock signal is then stored. That stored logical state provides an indication as to the magnitude of the delay of the integrated circuit which may then be used to tune critical signals of the integrated circuit to avoid timing problems resulting from variations in IC propagation delay.

REFERENCES:
patent: 3601537 (1971-08-01), Gueldenpfenning et al.
patent: 3739160 (1973-06-01), El-Hasan et al.
patent: 3997740 (1976-12-01), Eubank et al.
patent: 4177388 (1979-12-01), Lingenfelter
patent: 4251805 (1981-02-01), Holzmann et al.
patent: 5087828 (1992-02-01), Sato et al.
patent: 5245231 (1993-09-01), Kocis et al.
patent: 5465065 (1995-11-01), Stevens
patent: 5534808 (1996-07-01), Takaki et al.
patent: 5744992 (1998-04-01), Baumann
patent: 6680636 (2004-01-01), Parry et al.
patent: 6720811 (2004-04-01), Yazawa et al.
patent: 6756833 (2004-06-01), Miura
Horowitz et al., “The Art of Electronics”, Cambridge University Press, 1980, pp. 343-344.

Affiliated with

Also associated with

Rating

Circuit and method for determining integrated circuit... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit and method for determining integrated circuit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit and method for determining integrated circuit... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3650022