Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2007-12-20
2010-02-02
Mai, Son L (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S230060
Reexamination Certificate
active
07656729
ABSTRACT:
A column address decoding circuit of a semiconductor memory apparatus includes a predecoder configured to combine a column address and a decoding test signal, thereby outputting a decoding address. A main decoder receives the decoding address, thereby outputting a plurality of column select signals.
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Baker & McKenzie LLP
Hynix / Semiconductor Inc.
Mai Son L
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