Circuit and method for calibrating DRAM pullup Ron to...

Details Circuit and method for calibrating DRAM pullup Ron to... Circuit and method for calibrating DRAM pullup Ron to...

2005-04-26

2005-04-26

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Circuit tuning

C702S116000, C702S182000, C702S183000

Reexamination Certificate

active

06885959

ABSTRACT:
Embodiments of the present invention enable the matching of pull-up and pull-down driver strengths of a slave device (DDRII SDRAM), i.e., the P-channel/N-channel driver pull-up/pull-down Ron and also calibrates the P-channel/N-channel pull-up/pull-down drivers in their linear region of operation. Specifically, embodiments of the present invention may use the DDR-II Off Chip Driver (OCD) protocol for calibration, in addition to using circuit techniques to calibrate the slave driver pull-up Ron within 1 LSB of the pull-down Ron.

REFERENCES:
patent: 6356106 (2002-03-01), Greeff et al.
patent: 6445316 (2002-09-01), Hsu et al.
patent: 20030184343 (2003-10-01), Kuge
patent: 20030223303 (2003-12-01), Lamb et al.

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