Circuit and method for antifuse stress test

Details Circuit and method for antifuse stress test Circuit and method for antifuse stress test

1997-07-14

1998-12-08

Fears, Terrell W.

Static information storage and retrieval

Read/write circuit

Testing

365226, G11C 1300

Patent

active

058480102

ABSTRACT:
A test circuit for stress testing antifuses before programming. The test circuit provides a voltage to an antifuse detection circuit during antifuse stress testing. In one embodiment, the provided voltage is externally received at a probe pad. In another embodiment, the test circuit controls a voltage generating circuit output voltage from a normal operating voltage to a stress voltage, such as by shifting the ground reference for the voltage generating circuit. The stress voltage can be varied as needed for a particular test setup and/or for different batches of antifuse circuits. Since the stress voltage is independent of the power supply voltage VCC, antifuse stressing can be concurrent with other pre-fuse tests, obviating the need for a dedicated antifuse stress test and reducing test time.

REFERENCES:
patent: 5155704 (1992-10-01), Walther et al.
patent: 5212442 (1993-05-01), O'Toole et al.
patent: 5315177 (1994-05-01), Zagar et al.
patent: 5408435 (1995-04-01), McClure et al.

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