Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Flip chip
Reexamination Certificate
2006-07-04
2006-07-04
Potter, Roy (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Flip chip
C257S737000
Reexamination Certificate
active
07071570
ABSTRACT:
A chip scale package has an insulating layer formed on the upper surface of a chip provided with a plurality of terminals on its one surface, a plurality of conductive layers formed on the insulating layer and spaced from each other by a designated distance so as to be connected to each of a plurality of the terminals, and a plurality of electrode surface layers formed on each of the upper surfaces of a plurality of the conductive layers.
REFERENCES:
patent: 5441898 (1995-08-01), Richards et al.
patent: 5554887 (1996-09-01), Sawai et al.
patent: 6177719 (2001-01-01), Huang et al.
patent: 6187615 (2001-02-01), Kim et al.
patent: 6205089 (2001-03-01), Itoh
patent: 6300686 (2001-10-01), Hirano et al.
patent: 6441500 (2002-08-01), Sumikawa et al.
patent: 6492198 (2002-12-01), Hwang
patent: 1246731 (2000-03-01), None
patent: 100 45 043 (2001-04-01), None
patent: 1 085 561 (2001-03-01), None
Patent Abstracts of Japan, Publication No. 08-340002, Dec. 24, 2996.
Patent Abstracts of Japan, Publication No. 09-102667, Apr. 15, 1997.
Patent Abstracts of Japan, Publication No. 11-121647, Apr. 30, 1999.
Bae Suk Su
Choi Yong Chil
Yoon Joon Ho
Lowe Hauptman & Berner LLP.
Potter Roy
Samsung Electro-Mechanics Co. Ltd.
LandOfFree
Chip scale package and method of fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Chip scale package and method of fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Chip scale package and method of fabricating the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3535210