Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead
Reexamination Certificate
2008-07-08
2008-07-08
Chambliss, Alonzo (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
With contact or lead
C257S758000, C257S773000, C257S780000, C257SE23021, C438S110000, C438S120000, C438S622000
Reexamination Certificate
active
10996535
ABSTRACT:
A thin film semiconductor die circuit package is provided utilizing low dielectric constant (k) polymer material for the insulating layers of the metal interconnect structure. Five embodiments include utilizing glass, glass-metal composite, and glass/glass sandwiched substrates. The substrates form the base for mounting semiconductor dies and fabricating the thin film interconnect structure.
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Huang Ching-Cheng
Lee Jin-Yuan
Lin Mou-Shiung
Ackerman Stephen B.
Chambliss Alonzo
Megica Corporation
Pike Rosemary L. S.
Saile Ackerman LLC
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