Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-12-12
2010-02-02
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C714S726000
Reexamination Certificate
active
07657850
ABSTRACT:
A scan chain planning method uses physical data with a hierarchical design to optimize chip level scan chains. Specifically, location data of physical blocks is used to determine optimal partitioning of the hierarchical design to balance chip level scan chains and reduce the number block scan ports by determining optimal locations for the block scan ports. Actual layout of the scan chains is based on the locations of the block scan ports and the number of scan elements determined by the method for each block scan chain.
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Hu Huaming
Huang Lin
Dinh Paul
Mao Edward S.
Nguyen Nha T
Silicon Valley Patent & Group LLP
Synopsys Inc.
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