Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-01-03
2009-08-04
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S014000
Reexamination Certificate
active
07571400
ABSTRACT:
A chip design verifying and chip testing apparatus includes a storing means for storing an application program verifying an operation of a designed chip and testing a manufactured chip having a plurality of blocks, an I/O file, and a test vector; an interface means controlling a data transmission between the storing means and the chip, and having a data applying means for applying the I/O file and/or the test vector outputted from the storing means and a data storing means for storing data outputted from the chip; and a computer including a CPU for performing and controlling the application program.
REFERENCES:
patent: 5535223 (1996-07-01), Horstmann et al.
patent: 5613102 (1997-03-01), Chiang et al.
patent: 5650938 (1997-07-01), Bootehsaz et al.
patent: 5963735 (1999-10-01), Sample et al.
patent: 6009256 (1999-12-01), Tseng et al.
patent: 6016563 (2000-01-01), Fleisher
patent: 6067652 (2000-05-01), Fusco et al.
patent: 6205407 (2001-03-01), Testa et al.
patent: 6651225 (2003-11-01), Lin et al.
patent: 6678645 (2004-01-01), Rajsuman et al.
patent: 6704895 (2004-03-01), Swoboda et al.
patent: 6785873 (2004-08-01), Tseng
patent: 6964034 (2005-11-01), Snow
patent: 7065481 (2006-06-01), Schubert et al.
patent: 0964346 (2004-01-01), None
patent: 59090067 (1984-05-01), None
patent: 61056984 (1986-03-01), None
patent: 04019579 (1992-01-01), None
patent: 05150009 (1993-06-01), None
patent: 07140211 (1995-06-01), None
patent: 07167922 (1995-07-01), None
patent: 08136614 (1996-05-01), None
patent: 11083946 (1999-03-01), None
patent: 2000065904 (2000-03-01), None
Translation of Office Action as issued by German Patent and Trademark Office; Jan. 14, 2008. All references cited in the foreign Office action and not previously submitted are listed above.
Park Hyun-Ju
Yun Dong-goo
Cantor & Colburn LLP
Levin Naum B
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