Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-10
2006-10-10
Tang, Minh Nhut (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07119565
ABSTRACT:
A chip carrier for testing electrical performance of a passive component includes: a core layer having a plurality of conductive traces on a surface thereof; at least one first trace connected with the passive component and having a first predetermined position and two ends, wherein the two ends are respectively electrically connected to a first bond finger on the surface of the chip carrier and to a first ball pad on an opposite surface of the chip carrier; at least one second trace not connected with the passive component and having two ends and a second predetermined position located on the same surface as the first predetermined position, one end of the second trace being electrically connected to a second ball pad located on the same surface as the first ball pad; and a solder mask layer applied over the conductive traces, with the first and second predetermined positions exposed.
REFERENCES:
patent: 5698895 (1997-12-01), Pedersen et al.
patent: 6078186 (2000-06-01), Hembree et al.
patent: 6486528 (2002-11-01), Pedersen et al.
patent: 6577490 (2003-06-01), Ogawa et al.
patent: 6646349 (2003-11-01), Pu et al.
patent: 6756663 (2004-06-01), Shiraishi et al.
patent: 6819127 (2004-11-01), Hembree
Chen Chien-Te
Huang Chien-Ping
Corless Peter F.
Edwards Angell Palmer & & Dodge LLP
Jensen Steven M.
Nguyen Tung X.
Siliconware Precision Industries Co. Ltd.
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