Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Patent
1997-11-26
1999-11-09
Baxter, Janet
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
556410, 556420, G03C 173, G03F 7075
Patent
active
059811439
ABSTRACT:
A photosensitive photoresist material which is effective for use as an ion etch barrier layer after patterning. The photoresist composition includes the reaction product of a compound having the general formula R.sub.1 --COO--(CH.sub.2).sub.n --O--R.sub.2 and a silylating agent.
REFERENCES:
patent: 4497891 (1985-02-01), Kaplan et al.
patent: 4689289 (1987-08-01), Crivello
patent: 5091290 (1992-02-01), Rolfson
patent: 5370908 (1994-12-01), O'Connor et al.
patent: 5688634 (1997-11-01), Mixon et al.
patent: 5741629 (1998-04-01), Chandross et al.
Jones William L.
Rogers Harvey N.
Tran Dean
Baxter Janet
Lee Sin J.
TRW Inc.
Yatsko Michael S.
LandOfFree
Chemically treated photoresist for withstanding ion bombarded pr does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Chemically treated photoresist for withstanding ion bombarded pr, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Chemically treated photoresist for withstanding ion bombarded pr will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1453675