Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2005-03-29
2005-03-29
Thornton, Yvette C. (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C526S266000, C526S270000, C549S369000, C549S357000
Reexamination Certificate
active
06872502
ABSTRACT:
A polymer for a chemically amplified negative photoresist and a photoresist composition are provided. A representative polymer of the invention is a compound of formula 5:wherein: R1through R5and R14through R17are defined as set fourth in the specification, and a, b, c, and d represent the mole ratios of each monomer, wherein a has a value of 0-0.5, b has a value of 0-0.9, c has a value of 0-0.3, and d has a value of 0-0.3, provided that a+b+c+d=1; and n represents the degree of polymerization of each polymer, and has a value of at least 2.
REFERENCES:
patent: 3256254 (1966-06-01), Reinhardt et al.
patent: 3666473 (1972-05-01), Colom et al.
patent: 4076727 (1978-02-01), Zey et al.
patent: 4115128 (1978-09-01), Kita
patent: 4173470 (1979-11-01), Fahrenholtz et al.
patent: 4311782 (1982-01-01), Buhr et al.
patent: 4405708 (1983-09-01), van Pelt et al.
patent: 4491628 (1985-01-01), Ito et al.
patent: 4975519 (1990-12-01), Yang et al.
patent: 5286808 (1994-02-01), Collins et al.
patent: 5585223 (1996-12-01), Fréchet et al.
patent: 5691111 (1997-11-01), Iwasa et al.
patent: 5756850 (1998-05-01), Iwasa et al.
patent: 5955241 (1999-09-01), Sato et al.
patent: 6028153 (2000-02-01), Jung
patent: 6042991 (2000-03-01), Aoai et al.
patent: 6074801 (2000-06-01), Iwasa et al.
patent: 6106998 (2000-08-01), Maeda et al.
patent: 6258508 (2001-07-01), Kim et al.
patent: 6482565 (2002-11-01), Jung et al.
patent: 20020143130 (2002-10-01), Lee et al.
Lee Beom-Wook
Lim Ik-Chul
Yoo Seung-Joon
Christie Parker and Hale, LLP
Samsung SDI & Co., Ltd.
Thornton Yvette C.
LandOfFree
Chemically amplified negative photoresist, and photoresist... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Chemically amplified negative photoresist, and photoresist..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Chemically amplified negative photoresist, and photoresist... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3447096