Chemical vapor deposition of high conductivity, adherent...

Coating processes – Coating by vapor – gas – or smoke

Reexamination Certificate

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C427S250000, C427S255280, C427S255310

Reexamination Certificate

active

10803750

ABSTRACT:
A multi-step method for depositing ruthenium thin films having high conductivity and superior adherence to the substrate is described. The method includes the deposition of a ruthenium nucleation layer followed by the deposition of a highly conductive ruthenium upper layer. Both layers are deposited using chemical vapor deposition (CVD) employing low deposition rates.

REFERENCES:
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patent: 6479100 (2002-11-01), Jin et al.
patent: 6680251 (2004-01-01), Won et al.
patent: 6743739 (2004-06-01), Shimamoto et al.
patent: 6849122 (2005-02-01), Fair
patent: 2003/0165615 (2003-09-01), Aaltonen et al.
patent: WO - 00/15885 (2000-03-01), None
Papadatos, Filippos, et al., Characterization of Ruthenium and Ruthenium Oxide Thin Films deposited by Chemical Vapor Deposition for CMOS Gate . . . , Mat. Res. Soc. Symp. Proc., 2003, pp. N3.3.1-N3.3.6, vol. 745.

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