Chemical mechanical polishing process for manufacturing...

Abrading – Abrading process

Reexamination Certificate

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Reexamination Certificate

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10964145

ABSTRACT:
A chemical-mechanical polishing (CMP) process for the manufacturing of semiconductor devices is disclosed. The process includes removing a first portion of a first layer of interconnect materials using a first platen and a first slurry, removing a second portion of the first layer using a second platen and a second slurry, removing a first portion of a second layer of the interconnect materials using a second platen and a third slurry, and removing a second portion of the second layer using a third platen and a fourth slurry.

REFERENCES:
patent: 6274475 (2001-08-01), Farkas et al.
patent: 6524959 (2003-02-01), Lu et al.
patent: 6573173 (2003-06-01), Farkas et al.
patent: 6830504 (2004-12-01), Chen et al.
patent: 2004/0074518 (2004-04-01), Korthuis et al.
patent: 2004/0266183 (2004-12-01), Miller et al.
patent: 2005/0016861 (2005-01-01), Laursen et al.
patent: 2005/0090104 (2005-04-01), Yang et al.

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