Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent
1997-09-30
2000-03-28
Utech, Benjamin
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
216 38, 216 89, H01L 21304
Patent
active
060431598
ABSTRACT:
Process for the chemical mechanical polishing of a layer of isolating material based on silicon or a silicon derivative, in which abrasion of the layer of isolating material is carried out by rubbing said layer using a fabric which brings into play an abrasive containing an acid aqueous solution of colloidal silica containing individualized colloidal silica particles, not linked together by siloxane bonds, and water as the suspension medium and new abrasives based on such suspensions.
REFERENCES:
patent: 4689656 (1987-08-01), Silvestri et al.
patent: 4944836 (1990-07-01), Beyer et al.
patent: 5480476 (1996-01-01), Cook et al.
patent: 5525191 (1996-06-01), Maniar et al.
patent: 5527423 (1996-06-01), Neville et al.
patent: 5575837 (1996-11-01), Kodama et al.
patent: 5769689 (1998-06-01), Cossaboon et al.
Jacquinot Eric
Rivoire Maurice
Clariant Chimie S.A.
Deo Duy-Vu
Utech Benjamin
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