Chemical-mechanical polishing (CMP) slurry and method of...

Compositions – Etching or brightening compositions

Reexamination Certificate

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Details

C252S079200, C051S307000, C051S308000, C210S631000

Reexamination Certificate

active

11447212

ABSTRACT:
Compositions and methods for planarizing or polishing a surface, particularly a semiconductor wafer surface. The polishing compositions described herein comprise (a) a liquid carrier; (b) purified clay; and optional additives, such as (c) a chemical accelerator; and (d) a complexing or coupling agent capable of chemically or ionically complexing with, or coupling to, the metal and/or insulating material removed during the polishing process. The complexing or coupling agent carries away the removed metal and/or silicon dioxide insulator particles, during polishing, to prevent the separated particles from returning to the surface from which they were removed. Also disclosed are methods of planarizing or polishing a surface comprising contacting the surface with the compositions.

REFERENCES:
patent: 5340370 (1994-08-01), Cadien et al.
patent: 5527423 (1996-06-01), Neville et al.
patent: 5575915 (1996-11-01), Nakamura et al.
patent: 5622525 (1997-04-01), Haisma et al.
patent: 5669942 (1997-09-01), McCullough
patent: 5958794 (1999-09-01), Bruxvoort et al.
patent: 6602439 (2003-08-01), Hampden-Smith et al.
patent: 2004/0216388 (2004-11-01), Mathur et al.
patent: 0 103 085 (1984-03-01), None
patent: 0 103 850 (1984-03-01), None
patent: WO-02/024759 (2002-03-01), None
patent: WO-03/064551 (2003-08-01), None
patent: WO-2004/06301 (2004-07-01), None
patent: WO-2004/063301 (2004-07-01), None
patent: WO-2004/083328 (2004-09-01), None
U.S. Appl. No. 60/455,216, filed Mar. 2003, Mathyr et al.
PCT International Search Report from the European Patent Office for International Patent Application No. PCT/US2005/02716 dated Sep. 23, 2005 (2 pages).
PCT International Search Report from the European Patent Office for International Patent Application No. PCT/US2004/031645 dated Jan. 3, 2005 (3 pages).
PCT International Search Report from the European Patent Office for International Patent Application No. PCT/US2004/031751 dated Jan. 3, 2005 (5 pages).

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