Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate
2005-05-31
2005-05-31
Nguyen, Dung Van (Department: 3723)
Abrading
Abrading process
Glass or stone abrading
C451S060000
Reexamination Certificate
active
06899597
ABSTRACT:
A semiconductive wafer having a layer of conductive material formed thereon is polished. The semiconductor wafer is rotated against an abrasive polishing pad. A solution is applied to the semiconductor wafer and to the abrasive polishing pad. The solution includes an etchant of the conductive material.
REFERENCES:
patent: 5972792 (1999-10-01), Hudson
patent: 6083419 (2000-07-01), Grumbine et al.
patent: 6211087 (2001-04-01), Gabriel et al.
patent: 6268293 (2001-07-01), Clevenger et al.
patent: 6303401 (2001-10-01), Nichterwitz et al.
patent: 6419554 (2002-07-01), Chopra et al.
patent: 6461226 (2002-10-01), Yi
patent: 6468897 (2002-10-01), Cheng et al.
patent: 6478659 (2002-11-01), Peng et al.
patent: 6479898 (2002-11-01), Hopper et al.
patent: 2002/0123299 (2002-09-01), Chopra et al.
patent: 2002/0168923 (2002-11-01), Kaufman et al.
Kyoung-Jun Kim et al., “CMP Characteristics According to Slurry Injection Position,” SemiWorld Journal. vol. 2 http://www.semiworld.com/sub_en/journal_en/journal0002_2_en.php 3.
Ho-Youn Kim et al., “Development of an Semi-Rigid Abrasive Pad for Chemical Mechanical Polishing,” SemiWorld Journal vol. 2, http://www.semiworld.com/sub_en/journal_en/journal0002_3_en.php3.
Hyoung-Jae Kim et al., “Viscoelastic Behavior of Polishing Pad and Its Influence on Polishing Non-uniformity,” SemiWorld Journal vol. 12, http://www.semiworld.com/sub_en/journal_en/journal0002_4_en.php3.
Simpson Alexander
Wrschka Peter
Nguyen Dung Van
Slater & Matsil L.L.P.
LandOfFree
Chemical mechanical polishing (CMP) process using fixed... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Chemical mechanical polishing (CMP) process using fixed..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Chemical mechanical polishing (CMP) process using fixed... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3440702