Chemical mechanical planarization apparatus

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Reexamination Certificate

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C451S067000, C451S451000

Reexamination Certificate

active

08057280

ABSTRACT:
A semiconductor process includes polishing a substrate with a slurry in an enclosure. Polishing the substrate is stopped. First mist is injected into the enclosure, such that the first mist has at least about 80% of saturation of a liquid or gaseous solvent in a carrier within the enclosure.

REFERENCES:
patent: 4678119 (1987-07-01), Doyle
patent: 5997392 (1999-12-01), Chamberlin et al.
patent: 6053801 (2000-04-01), Pinson et al.
patent: 6251001 (2001-06-01), Pinson et al.
patent: 6899592 (2005-05-01), Kojima et al.
patent: 6953391 (2005-10-01), Majumder et al.
patent: 6997782 (2006-02-01), Nishi et al.
patent: 7234999 (2007-06-01), Sakurai et al.
patent: 7361076 (2008-04-01), Sakurai et al.
patent: 2004/0016442 (2004-01-01), Cawlfield
patent: 2006/0014478 (2006-01-01), McClatchie et al.
patent: 2006/0223426 (2006-10-01), Guthrie et al.
patent: 2007/0246079 (2007-10-01), Pham

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