Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Reexamination Certificate
2011-08-02
2011-08-02
Souw, Bernard E (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Analyte supports
C250S440110, C250S441110, C977S854000, C310S012010
Reexamination Certificate
active
07989778
ABSTRACT:
A charged-particle optical system (100) such as an electron microscope has a vacuum chamber (102) with a space (104) for accommodating a specific one (114) of multiple specimens in operational use. The charged-particle optical system has a loader (106) with a part (108) that is moveable into and out of the space. The part is configured for attaching a specimen carrier (110), brought from outside the system, to a first holder (112) or to detach the carrier from the first holder and to remove the carrier from inside the system. The carrier accommodates a first specimen. The system has an interface (116) in a wall of the chamber for removably accommodating the first holder (112) or a second holder (118) with a second specimen (120) mounted thereon.
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Dona Pleun
Hermkens Jorn
Nederlof Frank
Oetelaar Johannes Antonius Maria Van Den
Wondergem Wim
FEI Company
Griner David
Scheinberg Michael O.
Scheinberg & Griner LLP
Souw Bernard E
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