Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1997-04-28
1998-10-27
Bowers, Jr., Charles L.
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
438790, 427526, 427527, 427529, 427531, 25049221, H01L 21316
Patent
active
058277862
ABSTRACT:
In forming an insulating film upon a selected region of a sample, a gaseous vapor is directed over the selected region for depositing a compound of the gaseous vapor containing elements of the insulating film. A charged particle beam is directed toward the selected region in order to decompose the deposited compound and provide the desired insulating film.
REFERENCES:
patent: 4845054 (1989-07-01), Mitchener
patent: 4851097 (1989-07-01), Hattori et al.
patent: 4874460 (1989-10-01), Nakagawa et al.
patent: 4876112 (1989-10-01), Kaito et al.
patent: 4930439 (1990-06-01), Sato et al.
patent: 4950498 (1990-08-01), Kaito
patent: 4976843 (1990-12-01), Ward et al.
patent: 5083033 (1992-01-01), Komano et al.
patent: 5148024 (1992-09-01), Watanabe
patent: 5196102 (1993-03-01), Kumar
patent: 5429730 (1995-07-01), Nakamura et al.
Fujino, K., `SiO.sub.2 Dep. By, A.P. and Low Temp. CVD Using Teos and Ozone`, J. Electrochem. Soc., vol. 137, No. 9, Sep. 1990 (pp. 2883-2887).
Haruki Komano et al, "A rewiring technique for integrated circuit operation analysis using a silicon oxide film deposited by a focused ion beam", J. Vac. Sci. Technol. B, vol. 9, No. 5, Sep./Oct. 1991 , pp. 2653, 2654, and 2655.
Bowers Jr. Charles L.
FEI Company
Whipple Matthew
LandOfFree
Charged particle deposition of electrically insulating films does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Charged particle deposition of electrically insulating films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Charged particle deposition of electrically insulating films will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1613652