Charged particle beam writing apparatus and method thereof

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Reexamination Certificate

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C250S492200, C250S492220

Reexamination Certificate

active

08080809

ABSTRACT:
A charged particle beam writing apparatus includes a unit emitting a charged particle beam, a stage on which a target workpiece to be written is placed, a unit correcting a reference position of a small region in a writing region, based on a pattern distortion obtained from positions of figures spread over substantially all writing region of a dummy target workpiece and written without correcting, a first deflector deflecting the beam, based on a corrected reference position obtained by correcting the reference position, a correction unit correcting a relative distance from the corrected reference position to an arbitrary position in the small region, based on a pattern distortion of the dummy, by using the reference position and a coefficient of a correction equation for correcting the reference position, and a second deflector further deflecting the beam from a position deflected by the first deflector, based on the relative distance corrected.

REFERENCES:
patent: 5168166 (1992-12-01), Hayakawa et al.
patent: 5422491 (1995-06-01), Sakamoto
patent: 6177680 (2001-01-01), Dick et al.
patent: 3197024 (2001-06-01), None

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