Charged particle beam writing apparatus and charged particle...

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

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C250S398000, C250S492220

Reexamination Certificate

active

07928414

ABSTRACT:
A charged particle beam writing apparatus includes an irradiation part configured to irradiate a charged particle beam; a first shaping aperture member having passing areas, that the charged particle beam passes through, on both sides of an area blocking the charged particle beam; a deflection part configured to deflect the charged particle beam that has passed through the first shaping aperture member; a second shaping aperture member having passing areas, that the charged particle beam passes through, on both sides of an area blocking the deflected charged particle beam; and a stage on which a target workpiece irradiated with the charged particle beam that has passed through the second shaping aperture member is placed.

REFERENCES:
patent: 4943730 (1990-07-01), Takemura et al.
patent: 5334282 (1994-08-01), Nakayama et al.
patent: 6040114 (2000-03-01), Inoue et al.
patent: 7099733 (2006-08-01), Naya et al.
patent: 7417715 (2008-08-01), Loopstra
patent: 2006-145746 (2006-06-01), None

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