Charged particle beam scanning device

Electric lamp and discharge devices: systems – Cathode ray tube circuits – With secondary emission stage in the cathode-ray tube

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Details

313300, 313411, 313495, H01J 2941

Patent

active

039366979

ABSTRACT:
A plurality of control plates is sandwiched between a cathode and a target to control the flow of charged particles such as electrons and ions between the cathode and the target. The cathode includes an elongated filament for generating charged particles such as electrons. A first electrode having a negative potential is positioned behind the filament with a second electrode having a positive potential interdigitated with the first electrode. Each control plate has a plurality of apertures formed therein which are effectively aligned with corresponding apertures on the other control plates. The aligned apertures form beam channels. The control plates have paired conductive electrodes thereon arranged at predetermined coded finger patterns. Voltages are selectively applied to the control plate electrodes by switching circuitry to focus the charged particles through the apertures associated with selective electrodes while simultaneously aborting the passage of charged particles through the apertures associated with the remaining electrodes. In this manner by selective switching control of the control plate a beam, or a plurality of beams, can be directed to a selected portion or portions of the target at the time.

REFERENCES:
patent: 3408532 (1968-10-01), Hultberg et al.
patent: 3600627 (1971-08-01), Goede
patent: 3803443 (1974-04-01), Hant

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