Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent
1991-08-07
1993-08-10
Anderson, Bruce C.
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
H01J 3726
Patent
active
052351882
ABSTRACT:
In a charged particle beam device, comprising a charged particle source for emitting a charged particle beam, a column comprising particle-optical elements which are enclosed by a column jacket and which serve to accelerate and focus the charged particle beam, the charged particle source comprising an emitter which is accommodated in an emitter chamber, a vibration-insensitive suspension of the emitter is achieved by connecting the emitter chamber to the column jacket via a tubular electrode system. Because the pumping device cooperating with the emitter chamber is arranged above the emitter chamber and in the prolongation of the column, disturbing effects of the pumping device on the emitter are reduced. Because the power supply unit is arranged in the vicinity of the emitter, high-voltage supply leads can be dispensed with, so that interference signals cannot reach the emitter via the supply leads. The use of optical communication via optical fibres prevents the occurrence of undesirable potentials in the equipment.
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Anderson Bruce C.
Eason Leroy
U.S. Philips Corporation
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